| Autor: |
Karasik, B.S., Il'in, K.S. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 4/15/1996, Vol. 68 Issue 16, p2285, 3p, 3 Graphs |
| Abstrakt: |
Examines the crossover between electron-phonon relaxation and diffusion transport of hot electrons in an niobium carbide microbolometer. Effect of high diffusivity on mixer device matching; Implication of the intrinsic noise mechanisms for mixer noise temperature; Disadvantage of using pure metals in the bolometer radio frequency impedance. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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