| Autor: |
Jianmin Ma, Xiaodi Liu, Liyan Wu |
| Zdroj: |
Crystal Research & Technology; Dec2008, Vol. 43 Issue 12, p1297-1299, 3p |
| Abstrakt: |
Tellurium thin film was prepared via a solvothermal route on glass substrates modified by exchaning the positive charge with high charge. It was characterized by SEM and XRD. The possible growth of tellurium thin film was proposed. It is expected that this method would be extended to other functional thin films. © 2008 WILEYVCH Verlag GmbH & Co. KGaA, Weinheim [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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