| Autor: |
Yota, Jiro, Ly, Hoa, Ramanathan, Ravi, Hsiang-Chih Sun, Barone, Dragana, Thinh Nguyen, Katoh, Kohji, Ohe, Masayuki, Hubbard, Robert L., Hicks, Keith |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Semiconductor Manufacturing; Aug2007, Vol. 20 Issue 3, p323-332, 10p, 5 Black and White Photographs, 7 Diagrams, 1 Chart, 9 Graphs |
| Abstrakt: |
Photosensitive polybenzoxazole (PRO) film has been used in GaAs heterojunction bipolar transistor (HBT) technology for stress buffer and mechanical protection layer applications. However, this film needs to be cured at high temperatures for a long period of time in order to obtain its desired excellent material characteristics. High-temperature curing can result in degradation to the electrical characteristics and performance of the underlying GaAs devices due to limited thermal budget. In this paper, we have characterized the effects of curing the PBO film on GaAs HBT wafers using a conventional convection furnace and using a variable frequency microwave (VFM) furnace. The results show that a VFM cure can achieve similar excellent physical, mechanical, thermal, and chemical material characteristics at a lower curing temperature and in a much shorter time, as com- pared to convection furnace curing, therefore resulting in minimal GaAs device degradation. Based on these results, an optimum curing condition using the VFM method can be obtained that satisfies both stress buffer layer material and device requirements for GaAs HBT technology. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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