| Autor: |
Olivier, Dhez, Mario, Rodrigues, Fabio, Comin, Roberto, Felici, Joel, Chevrier |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2007, Vol. 879 Issue 1, p1391-1394, 4p, 2 Diagrams, 4 Graphs |
| Abstrakt: |
With the advent of nanoscale science, the need of tools able to image samples and bring the region of interest to the X-ray beam is essential. We show the possibility of using the high resolution imaging capability of a scanning probe microscope to image and align a sample relative to the X-ray beam, as well as the possibility to record the photoelectrons emitted by the sample. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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