| Autor: |
Anoshina, N. A., Sorokin, D. V. |
| Předmět: |
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| Zdroj: |
Computational Mathematics & Modeling; Jan2023, Vol. 34 Issue 1, p1-15, 15p |
| Abstrakt: |
When constructing the three-dimensional model of a particle by means of single particle cryo-electron microscopy, an important step is particle projection alignment, which are grouped by their spatial similarities. This step helps to improve the quality of the microscopic particle projection images by averaging the aligned projections. In this work we present a two-dimensional image registration method, that can be effectively applied for projection alignment in single particle cryo-electron microscopy. The proposed method is based on calculating the correlation function between a pair of images and with the use of the Fourier–Bessel transform. We apply Laguerre projection method to calculate the Fourier-Bessel transform. For additional acceleration of calculations, it is suggested to use the fast algorithm for calculating projection coefficients, based on the Gauss-Laguerre quadrature in the calculation of the Hankel transform. The application of Laguerre projection method for the Fourier-Bessel transform calculation significantly accelerates the registration, and the use of fast projection coefficients calculation algorithm gives additional speed-up to the Laguerre projection methodwithout major registration errors. The experimental results on synthetic data with different level of noise have demonstrated the effectiveness of the proposed registration method. In addition, experiments on real data have clearly proved the applicability of the method to cryo-EM images. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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