| Autor: |
Bouvier, Caroline, Van Nuffel, Sebastiaan, Brunelle, Alain |
| Předmět: |
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| Zdroj: |
Surface Science Spectra; Jun2024, Vol. 31 Issue 1, p1-20, 20p |
| Abstrakt: |
ToF-SIMS is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This database focuses on eight lead-based historical inorganic pigments, manufactured following traditional recipes. Lead pigments have been widely used in painting until the late 19th century. Here, the negative polarity ToF-SIMS reference spectra using a Bi3+ primary ion species are presented. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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