Contrast mechanism at landing energy near 0 eV in super low-energy scanning electron microscopy.
| Autor: | Aoyama, Tomohiro, Mikmeková, Šárka, Kumagai, Kazuhiro |
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| Zdroj: | Microscopy; Jun2024, Vol. 73 Issue 3, p243-250, 8p |
| Databáze: | Complementary Index |
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