| Autor: |
Qiang Li, Dagang Liu, Fei Xiang, Laqun Liu, Huihui Wang, Shihab, Mohammed |
| Předmět: |
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| Zdroj: |
Frontiers in Physics; 2024, p01-09, 9p |
| Abstrakt: |
Currently, there is limited research on the influence of gas ionization on the pulse formation process in pulse power source-driven loads. This paper introduces a road-field-Particle-In-Cell (PIC)/Monte Carlo Collision (MCC) collaborative simulation method that can accurately simulate gas ionization in Linear Transformer Driver (LTD) electron beam generation (EBG). The method couples the electromagnetic field and charged particle simulated through PIC/MCC with the circuit modules, and the load's voltammetry characteristics can real-time feedback to the Blumlein Pulse Forming Network (BPFN) of the LTD. In contrast to prior simulations that used fitted ideal T-shaped pulse input waveforms to model the load, this method provides a clearer depiction of the influence of gas ionization on the pulse shape. Additionally, the paper conducts simulation studies on LTD electron beam generator operating at different argon gas pressures. The findings indicate that introducing gas can effectively increase current while reducing voltage amplitude, thereby lowering the diode impedance. A small amount of gas can slightly enhance peak power, but excessive gas diminishes peak power and significantly shortens voltage pulse width. This is attributed to the beneficial effect of a small amount of gas ionization-produced plasma on the device. However, an excessive amount of gas ionization-generated plasma can lead to impedance mismatch in the device, even resulting in a load short circuit. This phenomenon causes a decrease in pressure drop at the top, consequently shortening the pulse width. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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