Characterization of magnetic field for loading, trapping and transferring cold atom close to the atom chip's surface.
| Autor: | Kaewart, N, Thaicharoen, N, Sompet, P, Chattrapiban, N |
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| Zdroj: | Journal of Physics: Conference Series; Nov2023, Vol. 2653 Issue 1, p1-6, 6p |
| Databáze: | Complementary Index |
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