A Protocol for FIB-based TEM Specimen Preparation for Nanoscale Microstructural Characterization of Ceramics.
| Autor: | Rommel, S, Maita, J M, Davis, J R, Wollmershauser, J A, Feygelson, B, Lee, S W, Aindow, M |
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| Zdroj: | Microscopy & Microanalysis; 2023 Supplement, p506-508, 3p |
| Databáze: | Complementary Index |
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