| Autor: |
Park, Sujin, Choi, Hyunho, Yim, Taekyung, Kyung, Yunyoung, Jin, Younggil, Kim, Jaewon |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Jun2023, Vol. 54 Issue 1, p1564-1567, 4p |
| Abstrakt: |
Display panels manufactured in the FAB process are assembled with various films and components in the module (MOD) process, and their final quality is a result of accumulated the quality of hundreds of preceding processes. Due to these limitations, it is hard to analyze the cause of MOD's outliers relevant to the FAB process and much time and money are consumed to maintain the cause process to eliminate MOD outliers. Therefore, we propose a new explainable AI (XAI) approach to detect and improve the module process's outliers by finding the correlation between FAB and MOD in this paper. The proposed approach was verified for MOD outlier cases in the real world's OLED development and manufacturing process. As a result, it confirmed 96.8% of the average accuracy for classifications. This approach presents the FAB factor that caused MOD's outliers based on the correlation between the MOD and the FAB. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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