TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel.
| Autor: | Kollmer, Felix, Havercroft, Nathan, Henss, Anja, Arlinghaus, Henrik, Paul, Wolfgang, Moellers, Rudolf, Niehuis, Ewald |
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| Zdroj: | Microscopy & Microanalysis; Aug2019 Supplement, p1026-1027, 2p |
| Databáze: | Complementary Index |
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