Autor: |
Kimata, Tetsuya, Kato, Sho, Kobayashi, Tomohiro, Yamamoto, Shunya, Yamaki, Tetsuya, Terai, Takayuki |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 11/7/2022, Vol. 132 Issue 17, p1-6, 6p |
Abstrakt: |
Glassy carbon substrates were implanted with 100 keV platinum ions. The implanted samples were analyzed using cross-sectional transmission electron microscopy (TEM) and x-ray photoelectron spectroscopy. Ion beam sputtering significantly affected the depth profile during platinum-ion implantation. Cross-sectional TEM revealed that the implanted platinum atoms were in the amorphous state and did not aggregate. Chemical state analysis of the platinum-ion-implanted glassy carbon substrates suggested that lattice defects in the substrates owing to the platinum-ion implantation caused the platinum–carbon interaction with electron transfer from platinum to carbon. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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