A Time-of-Flight Atomic Analyzer with 2D Electrostatic Focusing.

Autor:	Afanasyev, V. I., Kozlovskii, S. S., Melnik, A. D., Mironov, M. I., Navolotskii, A. S., Nesenevich, V. G., Petrov, M. P., Petrov, S. Ya., Chernyshev, F. V.
Předmět:	ELECTROSTATIC analyzers COINCIDENCE circuits DISTRIBUTION (Probability theory) FAST ions FOCUSED ion beams TRITIUM ION beams
Zdroj:	Plasma Physics Reports; Aug2022, Vol. 48 Issue 8, p829-837, 9p
Abstrakt:	A scheme of a multichannel time-of-flight atomic analyzer with an electrostatic deflection system that provides two-dimensional focusing of the ion beam in the transverse direction is described. A thin carbon film with a thickness of 100 Å is used to ionize the incoming flow of atoms. The results of numerical simulation of the main parameters of the analyzer, such as the energy values in the channels, their energy resolution, and permeability, are given. An example of the possible use of such an atomic analyzer for measuring the energy distribution function of thermal plasma ions and fast ions of heating beams in the deuterium–tritium operating regime of the TRT facility is considered. The efficiency of radiation background suppression in the analyzer detection system by the coincidence circuit has been analyzed. [ABSTRACT FROM AUTHOR]
Databáze:	Complementary Index
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