Characterization of photon counting detectors for x-ray diffraction (XRD) applications.

Autor: Ruiz, Sarah D., Gude, Zachary W., Hurlock, Ava X., Ferguson, Kyle, Miller, Casey, Carpenter, Joshua H., Greenberg, Joel A., Gehm, Michael E.
Zdroj: Proceedings of SPIE; 3/12/2022, Vol. 12104, p121040A-121040A-8, 1p
Databáze: Complementary Index