S/D Engineering for Sub-100 nm MOSFET using Ultra Shallow Junction Formation Technique, Elevated S/D Structure and SALICIDE Technique.

Autor: Ohuchi, Kazuya, Adachi, Kanna, Hokazono, Akira, Toyoshima, Yoshiaki
Zdroj: MRS Online Proceedings Library; 2002, Vol. 717 Issue 1, p1-12, 12p
Databáze: Complementary Index