Scanning Probe Microscopy (SPM) for the Investigation of Local Electrical Properties of High-K Dielectric/Ferroelectric Films.

Autor: Landau, S. A., Weiß, P. A., Junghans, N., Kolbesen, B. O., Adderton, D., Schindler, G., Hartner, W., Hintermaier, F., Dehm, C., Mazuré, C.
Zdroj: MRS Online Proceedings Library; Dec1999, Vol. 561 Issue 1, p567-572, 6p
Databáze: Complementary Index
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