Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters.

Autor: Benson, Chris, Price, Robert A., Silvie, Jon, Jaksic, Aleksandar, Joyce, Malcolm J.
Zdroj: Physics in Medicine & Biology; Jul2004, Vol. 49 Issue 14, p3145-3159, 15p
Databáze: Complementary Index