The influence of ZnO layer thickness on the performance and electrical bias stress instability in ZnO thin film transistors.
| Autor: | Ngwashi, Divine Khan, Mih, Thomas Attia, Cross, Richard B M |
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| Zdroj: | Materials Research Express; Feb2020, Vol. 7 Issue 2, p1-7, 7p |
| Databáze: | Complementary Index |
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