| Autor: |
Houchouas, Valentin, Darces, Muriel, Hélier, Marc, Cottais, Emmanuel, Esteves, José Lopes |
| Předmět: |
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| Zdroj: |
Progress in Electromagnetics Research C; 2020, Vol. 102, p109-125, 17p |
| Abstrakt: |
Coupling in electronic devices may be a threat for the security of the information they process. Indeed, a current flowing into a conductor may radiate an electromagnetic field that will couple onto other conductors creating parasitic signals. If this current conveys sensitive information, its confidentiality may not be guaranteed. Moreover, depending on the amplitude of these parasitic signals, dysfunction may occur. It is thus valuable to assess the coupling effects in order to evaluate the probability that a current or a voltage reaches a given magnitude. This relevant quantity may be an input for a risk analysis process. In this study, we will focus on the study of couplings in reverberant cavities, and especially into the chassis of desktop computers. We will highlight that the Random Coupling Model (RCM) may be applied to determine statistical quantities related to induced currents or voltages between several ports placed inside a reverberant environment. Comparisons with experimental data, for several system configurations, show that the application of this model is relevant and allows to rapidly obtain the percentiles of the induced currents. At first, the coupling between two monopoles is studied, and then the coupling between printed circuit boards that are stacked together is investigated. Finally, the effect of adding broadband absorbers in casings is assessed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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