Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness.
| Autor: | Liubchenko, O. I., Kladko, V. P. |
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| Zdroj: | Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii; Jun2018, Vol. 40 Issue 6, p759-776, 18p |
| Databáze: | Complementary Index |
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