| Autor: |
Pokharel, A., Sthal, F., Imbaud, J., Ghosh, S., Devel, M., Esnault, F. X., Cibiel, G. |
| Předmět: |
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| Zdroj: |
Fluctuation & Noise Letters; Sep2018, Vol. 17 Issue 3, pN.PAG-N.PAG, 6p |
| Abstrakt: |
The unclear physical origin of flicker noise in ultra-stable quartz oscillators is still limiting some practical metrological applications. In this paper, we study experimentally the possible correlations between Q-factor measurements at low temperature (4 K) and the level of flicker noise at nominal operating temperature (353 K). Results for 10 Stress-Compensated-cut (SC-cut) resonators with a 5 MHz resonant frequency and different noise levels (some excellent) are presented and commented, for several overtones and anharmonic modes. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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