On the determination of the substrate effective doping concentration of irradiated HV-CMOS sensors using an edge-TCT technique based on the Two-Photon-Absorption process.

Autor:	García, M. Fernández, Sánchez, J. González, Echeverría, R. Jaramillo, Moll, M., Montero, R., Moya, D., Pinto, R. Palomo, Vila, I.
Zdroj:	Journal of Instrumentation; Jan2017, Vol. 12 Issue 1, p1-1, 1p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu