Investigation of the role of void sizes for failure of high voltage bushing.
| Autor: | AJ, Christina, Salam, M. A., Ang, S. P., Fushuan Wen, Rahman, Q. M., Hasan, Syeed, Voon, William |
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| Zdroj: | 2016 IEEE Conference on Electrical Insulation & Dielectric Phenomena (CEIDP); 2016, p490-493, 4p |
| Databáze: | Complementary Index |
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