Research and practice on the whole life cycle test process model.

Autor: Ding, Jiwen, Yi, Xiushuang, Guo, Jun
Zdroj: 2016 17th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking & Parallel/Distributed Computing (SNPD); 2016, p553-556, 4p
Databáze: Complementary Index