Robust and reliable encapsulation of electronics for underwater applications.

Autor: Schwerz, R., Roellig, M., Frankenstein, B.
Zdroj: 2016 17th International Conference on Thermal, Mechanical & Multi-Physics Simulation & Experiments in Microelectronics & Microsystems (EuroSimE); 2016, p1-6, 6p
Databáze: Complementary Index