Physical Mechanism of BTI Degradation–Modeling of Process and Material Dependence.
| Autor: | Mahapatra, Souvik, Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Chaudhary, Ankush, Goel, Nilesh |
|---|---|
| Zdroj: | Fundamentals of Bias Temperature Instability in Mos Transistors; 2016, p127-179, 53p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|