A gate drive circuit for Normally-On SiC JFETs with self-protection functions against overcurrent and shoot-through fault conditions.

Autor: Giannoutsos, Spyridon V., Kokosis, Sotirios, Manias, Stefanos N.
Zdroj: 2015 IEEE 15th International Conference on Environment & Electrical Engineering (EEEIC); 2015, p851-859, 9p
Databáze: Complementary Index