Autor: |
Changyong Song, Kensuke Tono, Jaehyun Park, Tomio Ebisu, Sunam Kim, Hiroki Shimada, Sangsoo Kim, Gallagher-Jones, Marcus, Daewoong Nam, Takahiro Sato, Tadashi Togashi, Kanade Ogawa, Yasumasa Joti, Takashi Kameshima, Shun Ono, Takaki Hatsui, So Iwata, Makina Yabashi, Tetsuya Ishikawa |
Předmět: |
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Zdroj: |
Journal of Applied Crystallography; Feb2014, Vol. 47 Issue 1, p188-197, 10p |
Abstrakt: |
X-ray free-electron lasers (XFELs) provide intense (∼1012 photons per pulse) coherent X-rays with ultra-short (∼10-14 s) pulse lengths. X-rays of such an unprecedented nature have introduced new means of atomic scale structural investigations, and discoveries are still ongoing. Effective use of XFELs would be further accelerated on a highly adaptable platform where most of the new experiments can be realized. Introduced here is the multiple-application X-ray imaging chamber (MAXIC), which is able to carry out various single-pulse diffraction experiments including single-shot imaging, nanocrystallographic data acquisition and ultra-fast pump-probe scattering for specimens in solid, liquid and gas phases. The MAXIC established at the SPring-8 °ngström compact freeelectron laser (SACLA) has demonstrated successful applications in the aforementioned experiments, but is not limited to them. Also introduced are recent experiments on single-shot diffraction imaging of Au nanoparticles and serial crystallographic data collection of lysozyme crystals at SACLA. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
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