| Autor: |
Perregrini, Luca, Colantonio, Paolo, Berizzi, Fabrizio, Talai, Armin, Steinhäußer, Frank, Bittner, Achim, Schmid, Ulrich, Weigel, Robert, Koelpin, Alexander |
| Zdroj: |
International Journal of Microwave & Wireless Technologies; Jun2015, Vol. 7 Issue 3/4, p251-260, 10p |
| Abstrakt: |
An accurate characterization of microwave materials is essential for reliable high-frequency circuit design. This paper presents a measurement setup, which enables a quick and accurate determination of the relative permittivity of dielectric bulk materials up to 110 GHz. A ring-resonator is manufactured on a well-characterized substrate, serving as reference resonator. The material under test (MUT) is placed on top of the ring, which increases the effective permittivity and therefore introduces a shift of the resonance frequency of the resonator. In case of moderate to large dielectric losses of the MUTs, the quality factor of the resonator decreases perceptibly, which provides conclusions about the dielectric losses. Electromagnetic field simulations with different heights and relative permittivities of the MUTs provide a look-up table for the measured resonance frequencies. The functionality of the proposed measurement setup is validated by measurement results of different MUTs. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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