Test pattern generation in presence of unknown values based on restricted symbolic logic.
| Autor: | Erb, Dominik, Scheibler, Karsten, Kochte, Michael A., Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd |
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| Zdroj: | 2014 International Test Conference; 2014, p1-10, 10p |
| Databáze: | Complementary Index |
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