Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects.
| Autor: | Erb, Dominik, Scheibler, Karsten, Sauer, Matthias, Reddy, Sudhakar M., Becker, Bernd |
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| Zdroj: | 2014 IEEE 23rd Asian Test Symposium; 2014, p131-136, 6p |
| Databáze: | Complementary Index |
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