Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy.

Autor: Zheng Z; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA., Own CS; Voxa, Seattle, WA, USA., Wanner AA; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA.; Paul Scherrer Institute, Villigen, Switzerland., Koene RA; Voxa, Seattle, WA, USA., Hammerschmith EW; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA., Silversmith WM; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA., Kemnitz N; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA., Lu R; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA., Tank DW; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA., Seung HS; Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA. sseung@princeton.edu.
Jazyk: angličtina
Zdroj: Nature communications [Nat Commun] 2024 Aug 10; Vol. 15 (1), pp. 6860. Date of Electronic Publication: 2024 Aug 10.
DOI: 10.1038/s41467-024-50846-4
Abstrakt: Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of four beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in five weeks.
(© 2024. The Author(s).)
Databáze: MEDLINE
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