Wiring surface loss of a superconducting transmon qubit.

Autor: Smirnov NS; FMN Laboratory, Bauman Moscow State Technical University, Moscow, Russia, 105005.; Dukhov Automatics Research Institute, VNIIA, Moscow, Russia, 127030., Krivko EA; FMN Laboratory, Bauman Moscow State Technical University, Moscow, Russia, 105005., Solovyova AA; FMN Laboratory, Bauman Moscow State Technical University, Moscow, Russia, 105005., Ivanov AI; FMN Laboratory, Bauman Moscow State Technical University, Moscow, Russia, 105005., Rodionov IA; FMN Laboratory, Bauman Moscow State Technical University, Moscow, Russia, 105005. irodionov@bmstu.ru.; Dukhov Automatics Research Institute, VNIIA, Moscow, Russia, 127030. irodionov@bmstu.ru.
Jazyk: angličtina
Zdroj: Scientific reports [Sci Rep] 2024 Mar 27; Vol. 14 (1), pp. 7326. Date of Electronic Publication: 2024 Mar 27.
DOI: 10.1038/s41598-024-57248-y
Abstrakt: Quantum processors using superconducting qubits suffer from dielectric loss leading to noise and dissipation. Qubits are usually designed as large capacitor pads connected to a non-linear Josephson junction (or SQUID) by a superconducting thin metal wiring. Here, we report on finite-element simulation and experimental results confirming that more than 50% of surface loss in transmon qubits can originate from Josephson junctions wiring and can limit qubit relaxation time. We experimentally extracted dielectric loss tangents of qubit elements and showed that dominant surface loss of wiring can occur for real qubits designs. Finally, we experimentally demonstrate up to 20% improvement in qubit quality factor by wiring design optimization.
(© 2024. The Author(s).)
Databáze: MEDLINE
Externí odkaz:
Nepřihlášeným uživatelům se plný text nezobrazuje