| Autor: |
Roschin BS; Federal Research Center 'Crystallography and Photonics', Russian Academy of Sciences, Leninsky ave. 59, 119333 Moscow, Russia., Argunova TS; Ioffe Institute, Russian Academy of Sciences, Polytekhnicheskaya st. 26, 194021 St. Petersburg, Russia., Lebedev SP; Ioffe Institute, Russian Academy of Sciences, Polytekhnicheskaya st. 26, 194021 St. Petersburg, Russia., Asadchikov VE; Federal Research Center 'Crystallography and Photonics', Russian Academy of Sciences, Leninsky ave. 59, 119333 Moscow, Russia., Lebedev AA; Ioffe Institute, Russian Academy of Sciences, Polytekhnicheskaya st. 26, 194021 St. Petersburg, Russia., Volkov YO; Federal Research Center 'Crystallography and Photonics', Russian Academy of Sciences, Leninsky ave. 59, 119333 Moscow, Russia., Nuzhdin AD; Federal Research Center 'Crystallography and Photonics', Russian Academy of Sciences, Leninsky ave. 59, 119333 Moscow, Russia. |
| Abstrakt: |
The synthesis of graphene by the graphitization of SiC surface has been driven by a need to develop a way to produce graphene in large quantities. With the increased use of thermal treatments of commercial SiC substrates, a comprehension of the surface restructuring due to the formation of a terrace-stepped nanorelief is becoming a pressing challenge. The aim of this paper is to evaluate the utility of X-ray reflectometry and grazing-incidence off-specular scattering for a non-destructive estimate of depth-graded and lateral inhomogeneities on SiC wafers annealed in a vacuum at a temperature of 1400-1500 °C. It is shown that the grazing-incidence X-ray method is a powerful tool for the assessment of statistical parameters, such as effective roughness height, average terrace period and dispersion. Moreover, these methods are advantageous to local probe techniques because a broad range of spatial frequencies allows for faster inspection of the whole surface area. We have found that power spectral density functions and in-depth density profiles manifest themselves differently between the probing directions along and across a terrace edge. Finally, the X-ray scattering data demonstrate quantitative agreement with the results of atomic force microscopy. |
