Dual-energy crystal-analyzer scheme for spectral tomography.

Autor: Zolotov D; Shubnikov Institute of Crystallography, Federal Scientific Research Centre 'Crystallography and Photonics' RAS, Leninsky prospekt 59, Moscow, 119333, Russian Federation., Buzmakov A; Shubnikov Institute of Crystallography, Federal Scientific Research Centre 'Crystallography and Photonics' RAS, Leninsky prospekt 59, Moscow, 119333, Russian Federation., Grigoriev M; Institute of Microelectronics Technology and High Purity Materials RAS, Ak. Osip'yan Street 6, Chernogolovka, Moscow Region, 142432, Russian Federation., Schelokov I; Shubnikov Institute of Crystallography, Federal Scientific Research Centre 'Crystallography and Photonics' RAS, Leninsky prospekt 59, Moscow, 119333, Russian Federation.; Institute of Microelectronics Technology and High Purity Materials RAS, Ak. Osip'yan Street 6, Chernogolovka, Moscow Region, 142432, Russian Federation.
Jazyk: angličtina
Zdroj: Journal of applied crystallography [J Appl Crystallogr] 2020 May 27; Vol. 53 (Pt 3), pp. 781-788. Date of Electronic Publication: 2020 May 27 (Print Publication: 2020).
DOI: 10.1107/S1600576720005439
Abstrakt: In the present work, a method for adjusting a crystal analyzer to separate two characteristic lines from the spectrum of a conventional X-ray tube for simultaneous registration of tomographic projections is proposed. The experimental implementation of this method using radiation of a molybdenum anode ( K α 1 , K β lines) and a silicon Si(111) crystal analyzer in Laue geometry is presented. Projection images at different wavelengths are separated in space and can be recorded independently for further processing. Potential uses of this scheme are briefly discussed.
(© International Union of Crystallography 2020.)
Databáze: MEDLINE
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