Observation of Anderson localization in disordered nanophotonic structures.

Autor: Sheinfux HH; Technion, Israel Institute of Technology, Haifa 32000, Israel., Lumer Y; Technion, Israel Institute of Technology, Haifa 32000, Israel., Ankonina G; Technion, Israel Institute of Technology, Haifa 32000, Israel., Genack AZ; Physics Department, Queens College and Graduate Center of the City University of New York (CUNY), Flushing, NY 11367, USA., Bartal G; Technion, Israel Institute of Technology, Haifa 32000, Israel., Segev M; Technion, Israel Institute of Technology, Haifa 32000, Israel. msegev@tx.technion.ac.il.
Jazyk: angličtina
Zdroj: Science (New York, N.Y.) [Science] 2017 Jun 02; Vol. 356 (6341), pp. 953-956.
DOI: 10.1126/science.aah6822
Abstrakt: Anderson localization is an interference effect crucial to the understanding of waves in disordered media. However, localization is expected to become negligible when the features of the disordered structure are much smaller than the wavelength. Here we experimentally demonstrate the localization of light in a disordered dielectric multilayer with an average layer thickness of 15 nanometers, deep into the subwavelength regime. We observe strong disorder-induced reflections that show that the interplay of localization and evanescence can lead to a substantial decrease in transmission, or the opposite feature of enhanced transmission. This deep-subwavelength Anderson localization exhibits extreme sensitivity: Varying the thickness of a single layer by 2 nanometers changes the reflection appreciably. This sensitivity, approaching the atomic scale, holds the promise of extreme subwavelength sensing.
(Copyright © 2017, American Association for the Advancement of Science.)
Databáze: MEDLINE
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