XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam.

Autor: Dietrich PM; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Nietzold C; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Weise M; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Unger WE; Federal Institute for Materials Research and Testing, 12200 Berlin, Germany., Alnabulsi S; Physical Electronics, Inc., 17825 Lake Drive East, Chanhassen, Minnesota 55317., Moulder J; Physical Electronics, Inc., 17825 Lake Drive East, Chanhassen, Minnesota 55317.
Jazyk: angličtina
Zdroj: Biointerphases [Biointerphases] 2016 Jun 02; Vol. 11 (2), pp. 029603. Date of Electronic Publication: 2016 Jun 02.
DOI: 10.1116/1.4948341
Abstrakt: The growing interest in artificial bioorganic interfaces as a platform for applications in emerging areas as personalized medicine, clinical diagnostics, biosensing, biofilms, prevention of biofouling, and other fields of bioengineering is the origin of a need for in detail multitechnique characterizations of such layers and interfaces. The in-depth analysis of biointerfaces is of special interest as the properties of functional bioorganic coatings can be dramatically affected by in-depth variations of composition. In worst cases, the functionality of a device produced using such coatings can be substantially reduced or even fully lost.
Databáze: MEDLINE