Autor: |
Pusch A; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK., De Luca A; Department of Engineering, University of Cambridge, Cambridge CB3 0FA, UK., Oh SS; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK., Wuestner S; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK., Roschuk T; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK., Chen Y; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK.; Department of Electrical and Computer Engineering, National University of Singapore, 117576 Singapore., Boual S; Cambridge CMOS Sensors Ltd., Cambridge CB4 0DL, UK., Ali Z; Cambridge CMOS Sensors Ltd., Cambridge CB4 0DL, UK., Phillips CC; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK., Hong M; Department of Electrical and Computer Engineering, National University of Singapore, 117576 Singapore., Maier SA; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK., Udrea F; Department of Engineering, University of Cambridge, Cambridge CB3 0FA, UK., Hopper RH; Cambridge CMOS Sensors Ltd., Cambridge CB4 0DL, UK., Hess O; The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ, UK. |