2D electron temperature diagnostic using soft x-ray imaging technique.

Autor:	Nishimura K; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Sanpei A; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Tanaka H; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Ishii G; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Kodera R; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Ueba R; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Himura H; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Masamune S; Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan., Ohdachi S; National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292, Japan., Mizuguchi N; National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292, Japan.
Jazyk:	angličtina
Zdroj:	The Review of scientific instruments [Rev Sci Instrum] 2014 Mar; Vol. 85 (3), pp. 033502.
DOI:	10.1063/1.4867076
Abstrakt:	We have developed a two-dimensional (2D) electron temperature (T(e)) diagnostic system for thermal structure studies in a low-aspect-ratio reversed field pinch (RFP). The system consists of a soft x-ray (SXR) camera with two pin holes for two-kinds of absorber foils, combined with a high-speed camera. Two SXR images with almost the same viewing area are formed through different absorber foils on a single micro-channel plate (MCP). A 2D Te image can then be obtained by calculating the intensity ratio for each element of the images. We have succeeded in distinguishing T(e) image in quasi-single helicity (QSH) from that in multi-helicity (MH) RFP states, where the former is characterized by concentrated magnetic fluctuation spectrum and the latter, by broad spectrum of edge magnetic fluctuations.
Databáze:	MEDLINE
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