Thinking patterns and gut feeling in technology recognition and evaluation.
| Autor: | Scheiner, Christian W.1 scheiner@industrial-management.org, Baccarella, Christian V.1 baccarella@industrial-management.org, Bessant, John2 j.bessant@exeter.ac.uk, Voigt, Kai-Ingo1 voigt@industrial-management.org |
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| Zdroj: | Proceedings of ISPIM Conferences. Jun2012, Issue 23, p1-13. 13p. |
| Databáze: | Business Source Ultimate |
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