Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown.
| Autor: | Marinoni, Mathias1,2,3, Touboul, Antoine D.1 Antoine.Touboul@ies.univ-montp2.fr, Zander, Damien4, Petit, Christian4, Carvalho, Aminata M. J. F.1, Wrobel, Frédéric2, Saigné, Frédéric1, Weulersse, Cecile5, Miller, Florent5, Carrière, Thierry6, Lorfèvre, Eric7 |
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| Zdroj: | IEEE Transactions on Nuclear Science. Aug2009 Part 2 of 3, Vol. 56 Issue 4, p2213-2217. 5p. 5 Graphs. |
| Databáze: | Business Source Ultimate |
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