Physically-Based Threshold Voltage Determination for MOSFET's of All Gate Lengths.

Autor: Tsuno, Morikazu, Suga, Masato
Zdroj: IEEE Transactions on Electron Devices. Jul99, Vol. 46 Issue 7, p1429. 6p. 6 Black and White Photographs, 1 Diagram, 11 Graphs.
Databáze: Business Source Ultimate