Physically-Based Threshold Voltage Determination for MOSFET's of All Gate Lengths.
Autor: | Tsuno, Morikazu, Suga, Masato |
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Zdroj: | IEEE Transactions on Electron Devices. Jul99, Vol. 46 Issue 7, p1429. 6p. 6 Black and White Photographs, 1 Diagram, 11 Graphs. |
Databáze: | Business Source Ultimate |
Externí odkaz: |