Measurement of the internal photoeffect quantum yield in semiconductors.
| Autor: | Arbuzov, Yu.1, Evdokimov, V.1, Shepovalova, O.1 |
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| Zdroj: | Instruments & Experimental Techniques. Jul2013, Vol. 56 Issue 4, p444-448. 5p. 2 Diagrams, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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