Interactions of [sub μ]Al Acceptor Impurity in Weakly and Heavily Doped Silicon.

Autor: Mamedov, T. N., Andrianov, D. G., Herlach, D., Gorelkin, V. N., Stoıkov, A. V., Zimmermann, U.
Zdroj: JETP Letters. 10/10/2002, Vol. 76 Issue 7, p440. 4p.
Databáze: Academic Search Ultimate