Fast estimation of RL-loaded microelectronic interconnections delay for the signal integrity prediction.
| Autor: | Ravelo, Blaise1, Eudes, Thomas1 |
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| Zdroj: | International Journal of Numerical Modelling. Jul/Aug2012, Vol. 25 Issue 4, p338-346. 9p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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