Internal Friction Related to Changes in the Shape of Small Inclusions.

Autor: Andreev, Yu. N., Darinskiı, B. M., Moshnikov, V. A., Saıko, D. S., Yaroslavtsev, N. P.
Zdroj: Semiconductors. Jun2000, Vol. 34 Issue 6, p618. 3p.
Databáze: Academic Search Ultimate