Background estimation using a robust Bayesian analysis.
Autor: | David, W. I. F., Sivia, D. S. |
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Zdroj: | Journal of Applied Crystallography. Jun2001, Vol. 34 Issue 3, p318. 7p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |
Autor: | David, W. I. F., Sivia, D. S. |
---|---|
Zdroj: | Journal of Applied Crystallography. Jun2001, Vol. 34 Issue 3, p318. 7p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |