Electronic structural analysis of transparent In2O3–ZnO films by hard X-ray photoelectron spectroscopy

Autor:	Shibuya, Tadao1 tadao.shibuya@si.idemitsu.co.jp, Yoshinaka, Masahiro1, Shimane, Yukio1, Utsuno, Futoshi1, Yano, Koki1, Inoue, Kazuyoshi1, Ikenagab, Eiji2, Kim, Jung J.2, Ueda, Shigenori3, Obata, Masaaki3, Kobayashi, Keisuke3
Zdroj:	Thin Solid Films. Mar2010, Vol. 518 Issue 11, p3008-3011. 4p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect