Advantages of aberration correction for HRTEM investigation of complex layer compounds.
| Autor: | SPIECKER, E.1 Erdmann.Spiecker@ww.uni-erlangen.de, GARBRECHT, M.1, JÄGER, W.1, TILLMANN, K.2 |
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| Zdroj: | Journal of Microscopy. Mar2010, Vol. 237 Issue 3, p341-346. 6p. 4 Diagrams, 1 Graph. |
| Databáze: | Academic Search Ultimate |
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